RAIRO - Operations Research

Chance-constrained data envelopment analysis modeling with random-rough data

Rashed Khanjani Shiraz, Madjid Tavana and Debora Di Caprio

RAIRO-Oper. Res., 52 1 (2018) 259-284

Published online: 30 May 2018

DOI: 10.1051/ro/2016076

Rashed Khanjani Shiraz

Madjid Tavana

Debora Di Caprio

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)