RAIRO - Operations Research

A software reliability growth model with two types of errors

Shigeru Yamada, Shunji Osaki and Hiroyuki Narihisa

RAIRO-Oper. Res., 19 1 (1985) 87-104

Published online: 06 February 2017

DOI: 10.1051/ro/1985190100871

Shigeru Yamada

Shunji Osaki

Hiroyuki Narihisa

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