Volume 55, Number 6, November-December 2021
|Page(s)||3773 - 3795|
|Published online||17 December 2021|
Optimization of product line considering compatibility and reliability via discrete imperialist competitive algorithm
School of Management, Hangzhou Dianzi University, Hangzhou 310018, P.R. China
2 Department of Mathematics, China Jiliang University, Hangzhou 310018, P.R. China
* Corresponding author: firstname.lastname@example.org
Accepted: 21 November 2021
In the era of mass customization, designing optimal products is one of the most critical decision-making for a company to stay competitive. More and more customers like customized products, which will bring challenges to the product line design and the production. If a company adopts customers’ favorite levels, this may lead to lower product reliability, or incompatibility among the components that make up the product. Moreover, it is worth outsourcing certain attribute levels to reduce production cost, but customers may dislike these levels because of their delivery delay. If managers consider the compatibility issue, the quality issue, outsource determination, and the delivery due date in the product design and production stages, they will avoid unreasonable product configuration and many unnecessary expenses, thereby bringing benefits to the company. To solve this complicated problem, we establish a nonlinear program that maximizes Per-capita-contribution Margin considering Reliability Penalty. Since the integrated product line design and production problem is NP-hard, we propose an improved Discrete Imperialist Competitive Algorithm (DICA). The proposed DICA is compared with genetic algorithm (GA) and simulated annealing (SA) through extensive numerical experiment, and the results show that DICA displays 6%~17% and 5%~14% improvement over GA and SA in terms of solution quality, respectively.
Mathematics Subject Classification: 90B30 / 68W50 / 90B50
Key words: Mass customization / product line optimization / imperialist competitive algorithm / compatibility / product reliability
© The authors. Published by EDP Sciences, ROADEF, SMAI 2021
This is an Open Access article distributed under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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